Designing for test analog signal processors for MEMS-based inertial sensors

Author

Calvano, Jose Vicente ; Lubaszewski, Marcelo Soares

Author_Institution

Brazilian Navy Res. Inst., Rio de Janeiro, Brazil

fYear

2003

Firstpage

251

Lastpage

256

Abstract

Conceptually, signal processors are systems, with reasonable complexity, were different mathematical operations are performed over signals derived from different origins. This paper presents the preliminary results for a Design for Test Methodology for analog signal processors, which can be used for MEMS and for the basic electronic circuitry around the micromachine core. The methodology is based on an analysis and a synthesis recursive process, which guarantees a good trade-of between extra structures, used to implement built-in self-test features in the original design. Basically, the whole design process is founded over the building of a system, with structural blocks, with a dynamic behavior of 1st and 2nd order.

Keywords

analogue processing circuits; built-in self test; design for testability; fault simulation; inertial systems; microsensors; 1st order dynamic behavior; 2nd order dynamic behavior; MEMS-based inertial sensor; built-in self-test; design for test methodology; microelectromechanical system; micromachine core; structural block; synthesis recursive process; test analog signal processor; Built-in self-test; Circuit synthesis; Circuit testing; Design methodology; Electronic equipment testing; Micromechanical devices; Process design; Signal design; Signal processing; Signal synthesis;

fLanguage

English

Publisher

ieee

Conference_Titel

System-on-Chip for Real-Time Applications, 2003. Proceedings. The 3rd IEEE International Workshop on

Print_ISBN

0-7695-1944-X

Type

conf

DOI

10.1109/IWSOC.2003.1213044

Filename

1213044