DocumentCode
165817
Title
Nanoscale vacuum channel transistor
Author
Jin-Woo Han ; Meyyappan, M.
Author_Institution
Center for Nanotechnol., NASA Ames Res. Center, Moffett Field, CA, USA
fYear
2014
fDate
18-21 Aug. 2014
Firstpage
172
Lastpage
175
Abstract
Despite of high gain, fast speed, and superior distortion immunity, vacuum electronic devices have been replaced by solid-state devices such as transistors due to their poor reliability and high power consumption. Such constraints mostly appear as it is bulky and discrete. The weaknesses of the traditional vacuum tubes are solved if the vacuum tubes are made by silicon nanofabrication technologies and the operation mechanism is shifted from thermionic emission into field emission. In this work, sub 100-nm vacuum tubes are fabricated by using conventional silicon process. The gap formation methods beyond sub-lithographic limit are suggested and its current-voltage characteristics are presented.
Keywords
MOSFET; field emission; nanoelectronics; nanofabrication; semiconductor device reliability; thermionic emission; transistors; vacuum microelectronics; vacuum tubes; MOSFET; current-voltage characteristics; field emission; gap formation methods; high power consumption; nanoscale vacuum channel transistor; reliability; silicon nanofabrication technology; solid-state devices; sub-lithographic limit; thermionic emission; vacuum electronic devices; vacuum tubes; Cathodes; Electric fields; Electron tubes; Nanoscale devices; Reliability; Silicon; Transistors; field emission; nanoscale; silicon process; vacuum channel transistor; vacuum tube;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology (IEEE-NANO), 2014 IEEE 14th International Conference on
Conference_Location
Toronto, ON
Type
conf
DOI
10.1109/NANO.2014.6968160
Filename
6968160
Link To Document