• DocumentCode
    165817
  • Title

    Nanoscale vacuum channel transistor

  • Author

    Jin-Woo Han ; Meyyappan, M.

  • Author_Institution
    Center for Nanotechnol., NASA Ames Res. Center, Moffett Field, CA, USA
  • fYear
    2014
  • fDate
    18-21 Aug. 2014
  • Firstpage
    172
  • Lastpage
    175
  • Abstract
    Despite of high gain, fast speed, and superior distortion immunity, vacuum electronic devices have been replaced by solid-state devices such as transistors due to their poor reliability and high power consumption. Such constraints mostly appear as it is bulky and discrete. The weaknesses of the traditional vacuum tubes are solved if the vacuum tubes are made by silicon nanofabrication technologies and the operation mechanism is shifted from thermionic emission into field emission. In this work, sub 100-nm vacuum tubes are fabricated by using conventional silicon process. The gap formation methods beyond sub-lithographic limit are suggested and its current-voltage characteristics are presented.
  • Keywords
    MOSFET; field emission; nanoelectronics; nanofabrication; semiconductor device reliability; thermionic emission; transistors; vacuum microelectronics; vacuum tubes; MOSFET; current-voltage characteristics; field emission; gap formation methods; high power consumption; nanoscale vacuum channel transistor; reliability; silicon nanofabrication technology; solid-state devices; sub-lithographic limit; thermionic emission; vacuum electronic devices; vacuum tubes; Cathodes; Electric fields; Electron tubes; Nanoscale devices; Reliability; Silicon; Transistors; field emission; nanoscale; silicon process; vacuum channel transistor; vacuum tube;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2014 IEEE 14th International Conference on
  • Conference_Location
    Toronto, ON
  • Type

    conf

  • DOI
    10.1109/NANO.2014.6968160
  • Filename
    6968160