DocumentCode
1658299
Title
Variance of unitary RCS in the small perturbation theory´s valid field
Author
Weng, Hai-Xiao ; Li, Zong-Qian ; Liu, Ning
Author_Institution
Dept. of Electron. Eng., Tsinghua Univ., Beijing, China
fYear
1999
fDate
6/21/1905 12:00:00 AM
Firstpage
479
Lastpage
482
Abstract
The scattered intensity from rough random surface with known statistical properties is a random process. The scattering coefficient is used to estimate the scattered average power of this random process. To describe this process fully, more parameters such as the variance are needed. This paper extends previous work on the variance of unitary RCS at the first order small perturbation theory´s valid regions. A numerical simulation with the rough random surface generated by digital computer is performed to investigate its general validity.
Keywords
electromagnetic wave scattering; numerical analysis; perturbation theory; radar cross-sections; rough surfaces; digital computer; numerical simulation; rough random surface; scattered average power estimation; scattered intensity; scattering coefficient; small perturbation theory; unitary RCS variance; Digital communication; Fourier transforms; Numerical simulation; Performance evaluation; Power generation; Radar scattering; Rough surfaces; Surface roughness; Surface waves; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Electromagnetics and Its Applications, 1999. Proceedings. (ICCEA '99) 1999 International Conference on
Print_ISBN
0-7803-5802-3
Type
conf
DOI
10.1109/ICCEA.1999.825184
Filename
825184
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