DocumentCode
1658303
Title
Particle filtering in the presence of outliers
Author
Maíz, Cristina S. ; Míguez, Joaquín ; Djuric, Petar M.
Author_Institution
Dept. of Signal Theor. & Commun., Univ. Carlos III de Madrid, Leganes, Spain
fYear
2009
Firstpage
33
Lastpage
36
Abstract
Particle filters have become very popular signal processing tools for problems that involve nonlinear tracking of an unobserved signal of interest given a series of related observations. In this paper we propose a new scheme for particle filtering when the observed data are possibly contaminated with outliers. An outlier is an observation that has been generated by some (unknown) mechanism different from the assumed model of the data. Therefore, when handled in the same way as regular observations, outliers may drastically degrade the performance of the particle filter. To address this problem, we introduce an auxiliary particle filtering scheme that incorporates an outlier detection step. We propose to implement it by means of a test involving statistics of the predictive distributions of the observations. Specifically, we investigate the use of a proposed statistic called spatial depth that can easily be applied to multidimensional random variates. The performance of the resulting algorithm is assessed by computer simulations of target tracking based on signal-power observations.
Keywords
particle filtering (numerical methods); statistical distributions; target tracking; computer simulations; multidimensional random variates; nonlinear tracking; outlier detection; particle filtering; predictive distributions; signal processing tools; signal-power observations; spatial depth; statistics; target tracking; Degradation; Filtering; Multidimensional signal processing; Multidimensional systems; Particle filters; Particle tracking; Signal processing; Statistical analysis; Statistical distributions; Testing; Particle filtering; nonlinear tracking; outlier detection; spatial depth;
fLanguage
English
Publisher
ieee
Conference_Titel
Statistical Signal Processing, 2009. SSP '09. IEEE/SP 15th Workshop on
Conference_Location
Cardiff
Print_ISBN
978-1-4244-2709-3
Electronic_ISBN
978-1-4244-2711-6
Type
conf
DOI
10.1109/SSP.2009.5278645
Filename
5278645
Link To Document