Title :
Atomistic modeling of scratching process based on Atomic Force Microscope: Effects of temperature
Author :
Muhammad Khan, Hanif ; Kim, Sung-Gaun
Author_Institution :
Div. of Mech. & Automotive Eng., Kongju Nat. Univ., Cheonan, South Korea
Abstract :
A three-dimensional molecular dynamics model has been used to investigate the effects of temperature during atomic force microscopy (AFM) based scratching process. Effects of temperature have been taken into consideration as tribological properties are affected significantly by temperature. Deformation behavior, force components, tribological behavior and dislocations generation have been taken into consideration. It has been found that, low temperature like 200 K is better choice considering these aspects of nanometric scratching process.
Keywords :
atomic force microscopy; deformation; dislocations; molecular dynamics method; nanostructured materials; tribology; AFM; atomic force microscopy; atomistic modeling; deformation; dislocations; force components; nanometric scratching process; temperature effects; three-dimensional molecular dynamics model; tribological property; Atomic force microscopy; Atomic measurements; Fabrication; Friction; Nickel; Plastics; Scanning probe microscopy; Temperature; Thermostats; Vehicle dynamics;
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
DOI :
10.1109/INEC.2010.5424579
