Title :
Calibration techniques for a gigahertz test system
Author :
Keezer, D.C. ; Wenzel, R.J.
Keywords :
Calibration; Circuits; Delay; Frequency; Gallium arsenide; Logic testing; Multiplexing; Signal generators; System testing; Timing;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527865
