Title :
Image processing for structured illumination microscopy
Author_Institution :
Bioimaging Dev. Dept., Nikon Corp., Yokohama, Japan
Abstract :
Structured illumination microscopy (SIM) is one of the promising technique of super resolution microscopy. Super resolution image is reconstructed with twice as high resolution as conventional microscopy by illuminating patterned excitation light and analyzing multiple images. In this paper, I will review the principle of SIM, and discuss artifacts of the reconstructed image.
Keywords :
image reconstruction; image resolution; optical microscopy; SIM; image processing; image reconstruction; multiple image analysis; patterned excitation light; structured illumination microscopy; super resolution image; super resolution microscopy; Image reconstruction; Image resolution; Lighting; Microscopy; Modulation; Noise; Optical microscopy; artifact; image processing; structured illumination microscopy (SIM); super resolution microscopy;
Conference_Titel :
Information Optics (WIO), 2015 14th Workshop on
Conference_Location :
Kyoto
DOI :
10.1109/WIO.2015.7206919
