Title :
Fabrication of ultra-sharp single atom tips
Author :
Fu, Tsu-Yi ; Chiang, Chia-Lun ; Lin, Rung-Jiun ; Hou, Jin-Long ; Kuo, Hong-Shi ; Hwang, Ing-Shouh ; Tsong, Tien T.
Author_Institution :
Dept. of Phys., Nat. Taiwan Normal Univ., Taipei, Taiwan
Abstract :
Ultra high vacuum - field ion microscopy (UHV-FIM) with atomic resolution was used to study the methods of preparing ultra-sharp single atom tips. Several treatments including annealing, depositing, exposing to special gas, keep in a given atmosphere, and so on were the possible tactics to sharpen the tips. The sharpen results of various treatments were observed by field ion microscope. Two kinds of magnetic nano tips were formed. One is a PtCo pyramidal tip formed by surface faceting, the other is a Pt based Co tip formed by the SK mode epitaxy.
Keywords :
annealing; atom probe field ion microscopy; cobalt alloys; nanofabrication; nanomagnetics; nanostructured materials; platinum alloys; surface treatment; PtCo; SK mode epitaxy; annealing; atomic resolution; depositing; magnetic nanotips; pyramidal tip; special gas exposure; surface faceting; ultrahigh vacuum-field ion microscopy; ultrasharp single atom tips; Annealing; Atomic layer deposition; Epitaxial growth; Fabrication; Magnetic anisotropy; Magnetic materials; Microscopy; Perpendicular magnetic anisotropy; Physics; Temperature;
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
DOI :
10.1109/INEC.2010.5424585
