Title :
Investigation of RF Avalanche Inductive Effect on Reduction of Intermodulation Distortion of MOSFETs Using Volterra Series Analysis
Author :
Chie-In Lee ; Wei-Cheng Lin ; Yan-Tin Lin ; Bo-Siang Yang
Author_Institution :
Dept. of Electr. Eng. & Inst. of Commun. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
Abstract :
In this paper, reduction of intermodulation distortion (IMD) due to inductive behavior for radio frequency (RF) MOSFETs is explored using Volterra series based on a nonlinear model incorporating a physical inductive breakdown network for the first time. The calculated total magnitude of high-order nonlinearities is lower than individual results from a nonlinear transconductance and breakdown inductance. In addition, the analysis result shows that the phase difference between the nonlinear transconductance and the breakdown inductance is almost π. Cancellation between resistive nonlinearity and reactive nonlinearity from the inductance due to the avalanche delay is first reported. The input third-order intercept point (IIP 3) is improved at biases where the breakdown inductance nonlinearity dominates. Instead, linearity will decrease when the breakdown resistance dominates.
Keywords :
MOSFET; Volterra series; avalanche breakdown; intermodulation distortion; semiconductor device breakdown; RF avalanche inductive effect; Volterra series analysis; breakdown inductance nonlinearity; breakdown resistance; inductive breakdown network; input third-order intercept point; intermodulation distortion reduction; nonlinear transconductance; phase difference; radio frequency MOSFETs; Delays; Electric breakdown; Integrated circuit modeling; Linearity; MOSFET; Radio frequency; Semiconductor device modeling; Breakdown; MOSFETs; Volterra series; intermodulation distortion; nonlinearity cancellation;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2014.2387273