• DocumentCode
    1659315
  • Title

    Determination of the transmission coefficients for quantum structures using FDTD method

  • Author

    Peng, Yangyang ; Wang, Xiaoying ; Lu, Kejie ; Qu, Xiaofeng ; Sui, Wenquan

  • Author_Institution
    Zhejiang-California Nanosystems Inst., Zhejiang Univ., Hangzhou, China
  • fYear
    2010
  • Firstpage
    173
  • Lastpage
    174
  • Abstract
    The purpose of this work is to develop a simple method to incorporate quantum effect in traditional finite-difference time-domain (FDTD) simulators. Which could make it possible to co-simulate system includes quantum structures and traditional components. In this paper, tunneling transmission coefficient is calculated by solving time-domain Schrodinger equation with a developed FDTD technique, called FDTD-S method. To validate the feasibility of the method, a simple resonant tunneling diode (RTD) structure model has been simulated using the proposed method. The good agreement between the numerical and analytical results proves its accuracy. The effeteness and accuracy of this approach makes it a potential method for analysis and design of hybrid systems includes quantum structures and traditional field components.
  • Keywords
    Schrodinger equation; finite difference time-domain analysis; resonant tunnelling diodes; semiconductor device models; FDTD method; finite-difference time-domain simulators; hybrid systems; quantum effect; quantum structures; simple resonant tunneling diode structure; time-domain Schrodinger equation; tunneling transmission coefficient; Analytical models; Electronics industry; Finite difference methods; Frequency; Nanostructures; Physics; Resonant tunneling devices; Schrodinger equation; Semiconductor diodes; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2010 3rd International
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-3543-2
  • Electronic_ISBN
    978-1-4244-3544-9
  • Type

    conf

  • DOI
    10.1109/INEC.2010.5424609
  • Filename
    5424609