Title :
Notice of Retraction
Research on the applicability of the fair value measurement models to the degree of development of market economic systems
Author_Institution :
Accounting Dept., Zhengzhou Univ. of Light Ind., Zhengzhou, China
Abstract :
Notice of Retraction
After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.
We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.
The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.
Different market economic systems, or one market economic system in its different stages may have different levels of market development, and the different levels of market development may have different effects on the application of the fair value measurement model. Fair value measurement model has three levels and three measurement methods. This paper aims to discuss the applicability of the three levels and the three measurement methods of the fair value measurement model in various market economic systems (the government-led and planned economic system, the imperfect market economic system, system with no monopoly and completely free competition, system with monopoly and completely free competition, as well as government and market double-led market system), different items in the same economic system, and puts forward some proposals for the correct application of the fair value measurement model in a variety of situations, which can improve the usefulness of accounting information accordingly.
Keywords :
accounting; market research; monopoly; accounting information; fair value measurement models; market development; market economic systems; monopoly; Cost accounting; Monopoly; accounting measurement model; applicability; different level of market development; fair value; market economic system;
Conference_Titel :
Advanced Management Science (ICAMS), 2010 IEEE International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-6931-4
DOI :
10.1109/ICAMS.2010.5553309