• DocumentCode
    1659531
  • Title

    Enhancing lithography for 1.0 micron and larger designs

  • Author

    Levine, A.L.

  • Author_Institution
    Ultra Tech Stepper, San Jose, CA, USA
  • fYear
    1994
  • Firstpage
    251
  • Lastpage
    256
  • Abstract
    The market for integrated circuits with feature sizes above 1.0 μm continues to play a tremendous role in the overall IC market. These circuits are built in highly competitive environments. In order to successfully compete, manufacturing costs must be optimized. A limited number of new wafer fabs are being built for >1.0 μm designs; most additional capacity in this area comes from facilities that are upgraded. This paper evaluates the cost of ownership of the exposure tools that serve this market. Several costs are evaluated, including labor, maintenance, facilities, reticles/masks and capital. Issues unique to existing facilities, such as continuing production while changing equipment, are also addressed. Technology considerations, including yield and extendability, are discussed. Results indicate that lithography systems can be designed that are highly cost effective and efficiently implemented in an upgrade environment
  • Keywords
    lithography; exposure tools; extendability; feature sizes; lithography systems; manufacturing costs; masks; reticles; upgrade environment; wafer fabs; yield; Buildings; Circuits; Computer aided software engineering; Cost function; Lithography; Production facilities; Semiconductor device modeling; Space technology; Throughput; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop. 1994 IEEE/SEMI
  • Conference_Location
    Cambridge, MA
  • Print_ISBN
    0-7803-2053-0
  • Type

    conf

  • DOI
    10.1109/ASMC.1994.588263
  • Filename
    588263