DocumentCode :
1659585
Title :
Organic thickness dependence of organic field-effect transistor devices based on pentacene
Author :
Jaisutti, Rawat ; Yamwong, Wittawat ; Atthi, Nithi ; Pratontep, Sirapat ; Osotchan, Tanakorn
Author_Institution :
Dept. of Phys., Mahidol Univ., Bangkok, Thailand
fYear :
2010
Firstpage :
187
Lastpage :
188
Abstract :
The electrical properties of OFET devices were studied as a function of the thickness of pentacene active layer. A bottom gate, top contact structure was investigated by measuring the electrical characteristics with 100 ¿m channel length and comparing with the results of 2-D numerical simulation at various organic thickness layers. The saturated current at same gate voltage was increased when the pentacene film was thicker. From the simulation cross-section results, this is due to the carrier has to move from source to drain electrodes through the conducting channel and across the whole thick of active layer. However, these increasing currents are not only depending on conducting layer but also strongly depending on the increasing of threshold voltage when organic thickness is increased.
Keywords :
organic field effect transistors; organic semiconductors; semiconductor thin films; 2D numerical simulation; bottom gate-top contact structure; conducting channel; conducting layer; electrical characteristics; gate voltage; organic field-effect transistor devices; organic thickness; pentacene film; saturated current; size 100 mum; source-to-drain electrodes; threshold voltage; Contacts; Electric variables; Electric variables measurement; Electrodes; Length measurement; Numerical simulation; OFETs; Pentacene; Thickness measurement; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
Type :
conf
DOI :
10.1109/INEC.2010.5424619
Filename :
5424619
Link To Document :
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