• DocumentCode
    1659604
  • Title

    Applications of Low-loss Silicon Photonic Wire Waveguides with Carrier Injection Structures

  • Author

    Yamada, K. ; Tsuchizawa, T. ; Watanabe, T. ; Fukuda, H. ; Shinojima, H. ; Itabashi, S.

  • Author_Institution
    Microsyst. Integration Lab., NTT, Atsugi
  • fYear
    2007
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    A low-loss silicon photonic wire waveguide with low-impedance p-i-n carrier injection structures was developed. The propagation loss of the waveguide was less than 2 dB/cm and the input-impedance was adjustable around a few ten ohms. In a compact variable optical attenuator using this waveguide, the power consumption giving 30-dB attenuation was about 55 mW, and the response time was about 2 ns. A Mach-Zehndar interferometer switch with a sub-nanoseconds response was also developed. Moreover, ultra-fast extraction of photo-induced carriers was observed when reverse bias was applied to the p-i-n structure. Carrier lifetime time in the waveguide was measured to be less than 30 ps. Such a fast carrier extraction would enhance the efficiencies of silicon-based nonlinear optical devices.
  • Keywords
    Mach-Zehnder interferometers; carrier lifetime; elemental semiconductors; high-speed optical techniques; integrated optics; nonlinear optics; optical attenuators; optical losses; optical switches; optical waveguides; silicon; Mach-Zehndar interferometer switch; Si; carrier injection structures; carrier lifetime; fast carrier extraction; low-impedance carrier injection; low-loss waveguides; nonlinear optical devices; p-i-n carrier injection; photoinduced carriers; photonic wire waveguides; power 55 mW; propagation loss; silicon waveguides; subnanosecond response; time 2 ns; variable optical attenuator; Delay; Energy consumption; Optical attenuators; Optical interferometry; Optical switches; Optical waveguides; PIN photodiodes; Propagation losses; Silicon; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Group IV Photonics, 2007 4th IEEE International Conference on
  • Conference_Location
    Tokyo
  • Print_ISBN
    978-1-4244-0934-1
  • Type

    conf

  • DOI
    10.1109/GROUP4.2007.4347686
  • Filename
    4347686