DocumentCode :
1659813
Title :
Atomistic simulation of graphene nanoribbon tunneling transistors
Author :
Chauhan, Jyotsna ; Guo, Jing
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Florida, Gainesville, FL, USA
fYear :
2010
Firstpage :
200
Lastpage :
201
Abstract :
The recently discovered graphene nanoribbon (GNR) is ideal for tunneling FETs due to its symmetric bandstructure, light effective mass, and monolayer-thin body. In this work, we examine the device physics of p-i-n GNR tunneling FETs using atomistic quantum transport simulations. The important role of the edge bond relaxation in the device characteristics is identified. The device, however, has ambipolar I-V characteristics, which are not preferred for digital electronics applications. A properly designed gate underlap can effectively suppress the ambipolar I-V. A subthreshold slope of 14 mV/dec and a significantly improved on-off ratio can be obtained by the p-i-n GNR tunneling FETs. The on-current, which is low due to the tunneling barrier, can be improved by a lattice vacancy in the tunneling junction region due to the induced middle bandgap state.
Keywords :
effective mass; field effect transistors; graphene; nanostructured materials; C; ambipolar I-V characteristics; atomistic simulation; digital electronics; edge bond relaxation; graphene nanoribbon; lattice vacancy; light effective mass; monolayer thin body; p-i-n GNR tunneling FET; symmetric bandstructure; tunneling field effect transistor; Atomic layer deposition; Atomic measurements; Bonding; Effective mass; FETs; Lattices; PIN photodiodes; Photonic band gap; Physics; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
Type :
conf
DOI :
10.1109/INEC.2010.5424628
Filename :
5424628
Link To Document :
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