Title :
Proceedings. 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Abstract :
Presents the cover from the proceedings of this conference.
Keywords :
VLSI; circuit reliability; error correction; error correction codes; error detection; fault diagnosis; fault tolerance; field programmable gate arrays; integrated circuit interconnections; integrated circuit testing; integrated memory circuits; integrated optoelectronics; radiofrequency integrated circuits; system-on-chip; FPGA; RF circuits; VLSI systems; analog testing; circuit reliability; defect tolerance; dependability; error correcting codes; error correction; error detection; fault diagnosis; fault tolerance; high speed circuits; interconnect faults; memory test; optoelectronics; reconfigurable circuits; system reliability; system-on-chip test;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. 19th IEEE International Symposium on
Conference_Location :
Cannes, France
Print_ISBN :
0-7695-2241-6
DOI :
10.1109/DFTVS.2004.1347812
