DocumentCode
1660032
Title
Proceedings. 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
fYear
2004
Abstract
Presents the cover from the proceedings of this conference.
Keywords
VLSI; circuit reliability; error correction; error correction codes; error detection; fault diagnosis; fault tolerance; field programmable gate arrays; integrated circuit interconnections; integrated circuit testing; integrated memory circuits; integrated optoelectronics; radiofrequency integrated circuits; system-on-chip; FPGA; RF circuits; VLSI systems; analog testing; circuit reliability; defect tolerance; dependability; error correcting codes; error correction; error detection; fault diagnosis; fault tolerance; high speed circuits; interconnect faults; memory test; optoelectronics; reconfigurable circuits; system reliability; system-on-chip test;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. 19th IEEE International Symposium on
Conference_Location
Cannes, France
ISSN
1550-5774
Print_ISBN
0-7695-2241-6
Type
conf
DOI
10.1109/DFTVS.2004.1347812
Filename
1347812
Link To Document