A special march test to detect delay coupling faults for RAMs

Author

Azimane, Mohamed ; Ruiz, Antonio Lloris

Author_Institution

ED&T/Test, Philips Res. Lab., Eindhoven, Netherlands

Volume

2

fYear

2001

fDate

6/23/1905 12:00:00 AM

Firstpage

995

Abstract

This paper introduces the idea of the delay coupling faults between the memory cells and also shows a new method to integrate a test for them within march tests. March tests do not cover delay coupling faults, moreover, the correct sensitizing operation sequences are not sufficient to cover them because of the large propagation time required to affect the content of the coupled cell. To cover the delay coupling faults, a special test based on the idea of the logic state of the memory array is presented. The new and more efficient march test, called DITEC+, proves to be efficient to cover the delay coupling faults

Keywords

delays; fault diagnosis; integrated circuit testing; integrated memory circuits; random-access storage; DITEC+ test; RAM testing; coupled cell; delay coupling faults; fault coverage; logic state; march tests; memory array; memory cells; propagation time; simulation process; Computational modeling; Decoding; Delay effects; Fault detection; Laboratories; Logic arrays; Logic testing; Propagation delay; Random access memory; Read-write memory;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics, Circuits and Systems, 2001. ICECS 2001. The 8th IEEE International Conference on

Print_ISBN

0-7803-7057-0

Type

conf

DOI

10.1109/ICECS.2001.957641

Filename

957641