• DocumentCode
    1660192
  • Title

    Direct growth of horizontally aligned carbon nanotubes between electrodes and its application to field-effect transistors

  • Author

    Hayashi, Yasuhiko ; Jang, B. ; Iijima, T. ; Tokunaga, T. ; Afre, R.A. ; Tanemura, M. ; Amaratunga, G.A.J.

  • Author_Institution
    Dept. of Frontier Mater., Nagoya Inst. of Technol., Nagoya, Japan
  • fYear
    2010
  • Firstpage
    215
  • Lastpage
    216
  • Abstract
    This paper presents direct growth of horizontally aligned carbon nanotubes (CNTs) between two predefined various inter-spacing up to tens of microns of electrodes (pads) and its use as CNT field-effect transistors (CNT-FETs). The catalytic metals were prepared, consisting of iron (Fe), aluminum (Al) and platinum (Pt) triple layers, on the thermal silicon oxide substrate (Pt/Al/Fe/SiO2). Scanning electron microscopy measurements of CNT-FETs from the as-grown samples showed that over 80% of the nanotubes are grown across the catalytic electrodes. Moreover, the number of CNTs across the catalytic electrodes is roughly controllable by adjusting the growth condition. The Al, as the upper layer on Fe electrode, not only plays a role as a barrier to prevent vertical growth but also serves as a porous medium that helps in forming smaller nano-sized Fe particles which would be necessary for lateral growth of CNTs. Back-gate field effect transistors were demonstrated with the laterally aligned CNTs. The on/off ratios in all the measured devices are lower than 100 due to the drain leakage current.
  • Keywords
    carbon nanotubes; catalysis; field effect transistors; leakage currents; nanofabrication; scanning electron microscopy; semiconductor nanotubes; C; CNT-FET; back-gate field effect transistors; catalytic metal electrodes; direct growth; drain leakage current; field-effect transistors; growth condition; horizontally aligned carbon nanotubes; iron-aluminum-platinum triple layers; on-off ratios; scanning electron microscopy; thermal silicon oxide substrate; Aluminum; Carbon nanotubes; Current measurement; Electrodes; FETs; Iron; Leakage current; Platinum; Scanning electron microscopy; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2010 3rd International
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-3543-2
  • Electronic_ISBN
    978-1-4244-3544-9
  • Type

    conf

  • DOI
    10.1109/INEC.2010.5424640
  • Filename
    5424640