Title :
Co-design and refinement for safety critical systems
Author :
Ajer, A. ; Devienne, Philippe
Author_Institution :
Univ. of Sci. & Technol. of Lille 1, France
Abstract :
In this paper we focus on design entry of complex systems, that is, the highest abstract tier of the global system without implementation choices to such and such technologies. At this very first level, the use of a formal specification language is more and more considered as the foundation of a real validation process. What we would like to emphasize is that from a formal design entry, project management can be formally controlled by formal refinement. We propose an architecture that is based upon stepwise refinement of a formal model to achieve controllable implementations. This leads to implementations that are highly effective, but remain formally related to the first formal specification. Partitioning, fault tolerance, and system management are seen as particular cases of refinement in order to conceptualize systems correct by proven construction. In this paper, we present the basic principles of system methodologies and describe the methodology based on the refinement paradigm. In order to prove this approach, we have developed the B-HDL Tool based on VHDL (digital circuits) and B method (formal language based on set theory and logic). The benefits of such tools would be an amazing productivity gain, a better reuse of automation and a formal redundancy management.
Keywords :
fault tolerance; formal specification; hardware description languages; hardware-software codesign; logic partitioning; project management; redundancy; safety; set theory; B method; B-HDL tool; VHDL; automation reuse; co-design; fault tolerance; formal mode stepwise refinement; formal redundancy management; formal specification language; logic; partitioning; productivity gain; project management; safety critical systems; set theory; system management; validation process; Automation; Digital circuits; Fault tolerant systems; Formal languages; Formal specifications; Logic circuits; Productivity; Project management; Safety; Set theory;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. 19th IEEE International Symposium on
Print_ISBN :
0-7695-2241-6
DOI :
10.1109/DFTVS.2004.1347827