• DocumentCode
    1660626
  • Title

    Compression of VLSI test data by arithmetic coding

  • Author

    Hashempour, H. ; Lombardi, F.

  • Author_Institution
    Dept. of ECE, Northeastern Univ., Boston, MA, USA
  • fYear
    2004
  • Firstpage
    150
  • Lastpage
    157
  • Abstract
    This work presents arithmetic coding and its application to data compression for VLSI testing. The use of arithmetic codes for compression results in a codeword whose length is close to the optimal value as predicted by entropy in information theory. Previous techniques (such as those based on Huffman or Golomb coding) result in optimal codes for test data sets in which the probability model of the symbols satisfies specific requirements. We show that Huffman and Golomb codes result in large differences between entropy bound and sustained compression. We present compression results of arithmetic coding for circuits through a practical integer implementation of arithmetic coding/decoding and analyze its deviation from the entropy bound as well. A software implementation approach is proposed and studied in detail using industrial embedded DSP cores.
  • Keywords
    VLSI; arithmetic codes; automatic test equipment; decoding; entropy codes; integrated circuit testing; logic testing; ATE; Golomb coding; Huffman coding; VLSI testing; arithmetic coding; arithmetic decoding; compression ratio; embedded DSP cores; entropy bound; information theory; optimal value codeword length; software implementation; test data compression; Arithmetic; Circuit testing; Computer industry; Data compression; Decoding; Digital signal processing; Embedded software; Entropy; Information theory; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. 19th IEEE International Symposium on
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-2241-6
  • Type

    conf

  • DOI
    10.1109/DFTVS.2004.1347835
  • Filename
    1347835