Title :
Data integrity evaluations of Reed Solomon codes for storage systems [solid state mass memories]
Author :
Cardarilli, G.C. ; Ottavi, M. ; Pontarelli, S. ; Re, M. ; Salsano, A.
Author_Institution :
Dept. of Electron. Eng., Rome Univ., Italy
Abstract :
This paper introduces a very flexible approach for the evaluation of bit error rates (BER) attainable on storage systems which use Reed Solomon codes. These evaluations are based on the use of a Markov model to evaluate the probabilities of having an uncorrectable codeword. Differently from previous literature, the reported approach can take into account the impact of both erasures and random errors, allowing a smaller degree of approximation and better evaluation of BER improvement related to the introduction of scrubbing techniques. The flexibility of the proposed method is finally shown by applying it to different cases of interest.
Keywords :
Markov processes; Reed-Solomon codes; error correction codes; error detection codes; error statistics; semiconductor storage; BER; EDAC; Markov model; Reed Solomon codes; SSMM data integrity; bit error rates; erasure errors; error detection/correction codes; random errors; scrubbing techniques; solid state mass memories; storage systems; uncorrectable codeword probability; Bit error rate; Delay; Error correction codes; Instruments; Nonvolatile memory; Power system transients; Reed-Solomon codes; Semiconductor memory; Solid state circuits; Space missions;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. 19th IEEE International Symposium on
Print_ISBN :
0-7695-2241-6
DOI :
10.1109/DFTVS.2004.1347836