DocumentCode
1660742
Title
Formation of Cu or CU2 O nanoparticles embedded in a polyimide film for nanofloating gate memory
Author
Choi, Dong Joo ; Kim, Young-Ho
Author_Institution
Div. of Mater. Sci. & Eng., Hanyang Univ., Seoul, South Korea
fYear
2010
Firstpage
244
Lastpage
245
Abstract
A Cu nanoparticles/polyimide (PI) or Cu2O nanoparticles/PI hybrid materials were fabricated by curing at 350°C for 2 hours in H2 or N2 atmosphere respectively, which resulted from the decomposition of the complex formed between a Cu film and the PI precursor, polyamic acid (PAA). Two kinds of PI films, thermosetting PI and thermoplastic PI were used. The Al was deposited on the top PI as the top electrode and In as the bottom electrode was soldered on the back side of the samples. The memory effect of Al/PI/Cu (or Cu2O) nanoparticles/PI/ju-type Si (100) structure will be also discussed with the results of the capacitance-voltage (C-V) measured at room temperature.
Keywords
MIS devices; MIS structures; MOS memory circuits; copper; copper compounds; curing; metallic thin films; nanofabrication; nanoparticles; organic-inorganic hybrid materials; polymer films; Al; Cu; Cu2O; Si; capacitance-voltage measurement; curing; decomposition; nanofabrication; nanofloating gate memory; nanoparticles-polyimide hybrid materials; polyamic acid; temperature 293 K to 298 K; temperature 350 degC; thermoplastic polyimide film; thermosetting polyimide film; time 2 hour; Atmosphere; Atomic force microscopy; Capacitance-voltage characteristics; Curing; Nanoparticles; Nonvolatile memory; Polyimides; Semiconductor films; Transmission electron microscopy; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-3543-2
Electronic_ISBN
978-1-4244-3544-9
Type
conf
DOI
10.1109/INEC.2010.5424661
Filename
5424661
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