A STRUCTURE FOR BOARD-LEVEL MIXED-SIGNAL TESTABILITY
Author :
Wilkins, B.R.
fYear :
1992
Firstpage :
556
Keywords :
Application specific integrated circuits; Circuit testing; Design for testability; Digital circuits; Pins; Registers; Size control; Switches; Switching circuits; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1992. Proceedings., International
