• DocumentCode
    1660889
  • Title

    Robust low-cost analog signal acquisition with self-test capabilities

  • Author

    De Souza, Adão A., Jr. ; Carro, Luigi

  • Author_Institution
    Instituto de Informatica, Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
  • fYear
    2004
  • Firstpage
    239
  • Lastpage
    247
  • Abstract
    An architecture based on a parallel statistical sampler with digital post-processing is proposed to provide graceful performance degradation of data acquisition under a multiple failure scenario. After a self-configuration stage, an adaptive procedure keeps track of parametric variations on the signal path during operation and corrects the digital modeling block. Parametric faults are thus detected and their impact on the system behavior is minimized. The low-cost of the basic analog building block allows the inherent redundancy and the parallel reconstruction model of the architecture to bear faults with decreased dynamic performance. Analysis of the architecture and the digital modeling employed is presented, as well as measurement data to validate the feasibility of the approach.
  • Keywords
    adaptive signal detection; analogue integrated circuits; data acquisition; fault diagnosis; integrated circuit modelling; mixed analogue-digital integrated circuits; redundancy; signal sampling; adaptive procedure; analog building block; data acquisition performance degradation; digital modeling; digital modeling block; digital post-processing; mixed-signal embedded applications; multiple failure scenario; parallel reconstruction model; parallel statistical sampler based architecture; parametric faults; redundancy; robust low-cost analog signal acquisition; self-configuration stage; self-test capabilities; signal path parametric variations; system behavior; Built-in self-test; Circuit faults; Circuit noise; Circuit testing; Frequency; Instruments; Quantization; Robustness; Stochastic processes; Stochastic resonance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. 19th IEEE International Symposium on
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-2241-6
  • Type

    conf

  • DOI
    10.1109/DFTVS.2004.1347845
  • Filename
    1347845