• DocumentCode
    1661100
  • Title

    Amdahl Corporation Board Delay Test System

  • Author

    Oomman, Bejoy G. ; Kongara, Prasad ; Mallipeddi, Chittaranjan

  • fYear
    1992
  • Firstpage
    558
  • Keywords
    Automatic testing; Circuit faults; Circuit testing; Delay systems; Digital circuits; Fault detection; Sequential analysis; Sequential circuits; System testing; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527876
  • Filename
    527876
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1661100