Title :
Amdahl Corporation Board Delay Test System
Author :
Oomman, Bejoy G. ; Kongara, Prasad ; Mallipeddi, Chittaranjan
Keywords :
Automatic testing; Circuit faults; Circuit testing; Delay systems; Digital circuits; Fault detection; Sequential analysis; Sequential circuits; System testing; Test pattern generators;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527876
