DocumentCode
1661177
Title
Design of concurrent error-detectable VLSI-based array dividers
Author
Chen, Thou-Ho ; Chen, Liang-Gee ; Chang, Yi-Shing
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear
1992
Firstpage
72
Lastpage
75
Abstract
A building-block design for VLSI-based array dividers with concurrent error detection by recomputing using partitioned architecture (REPA) is proposed. The basic concept is that the divide array can be divided into two identical parts and its operation can be completed by using one part through two iterative calculations. With two such parts, a concurrent error detection scheme based on a space redundancy approach can be designed, and error detection is achieved at each iteration. The design is better than previous designs in terms of area requirement, time penalty, error detection capability, and detection period. Advanced analysis with m partitions is included. The experimental results are attractive, especially for certain designs with application-specified tradeoffs between speed performance and area cost
Keywords
VLSI; digital arithmetic; dividing circuits; error detection; fault tolerant computing; application-specified tradeoffs; area cost; area requirement; concurrent error detection; concurrent error-detectable VLSI-based array dividers; divide array; recomputing using partitioned architecture; space redundancy approach; speed performance; time penalty; Arithmetic; Circuit faults; Costs; Fault diagnosis; Fault tolerant systems; Integrated circuit interconnections; Process design; Redundancy; Reliability; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design: VLSI in Computers and Processors, 1992. ICCD '92. Proceedings, IEEE 1992 International Conference on
Conference_Location
Cambridge, MA
Print_ISBN
0-8186-3110-4
Type
conf
DOI
10.1109/ICCD.1992.276204
Filename
276204
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