Title :
Learning based on fault injection and weight restriction for fault-tolerant Hopfield neural networks
Author :
Kamiura, Naotake ; Isokawa, Teijiro ; Matsui, Nobuyuki
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Hyogo, Himeji, Japan
Abstract :
Hopfield neural networks tolerating weight faults are presented. The weight restriction and fault injection are adopted as fault-tolerant approaches. For the weight restriction, a range to which values of weights should belong is determined during the learning, and any weight being outside this range is forced to be either its upper limit or lower limit. A status of a fault occurring is then evoked by the fault injection, and calculating weights is made under this status. The learning based on both of the above approaches surpasses the learning based on either of them in the fault tolerance and/or in the learning time.
Keywords :
Hopfield neural nets; content-addressable storage; fault tolerant computing; learning (artificial intelligence); Hopfield associative memories; fault injection; fault tolerance; fault-tolerant Hopfield neural networks; fault-tolerant approaches; learning; learning time; occurring fault status; weight faults; weight lower limit; weight range; weight restriction; weight upper limit; Associative memory; Computer networks; Computer simulation; Concrete; Fault tolerance; Feedforward neural networks; Hebbian theory; Hopfield neural networks; Neural networks; Recurrent neural networks;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. 19th IEEE International Symposium on
Print_ISBN :
0-7695-2241-6
DOI :
10.1109/DFTVS.2004.1347858