DocumentCode :
1661406
Title :
AC Test Quality: Beyond Transition Fault Coverage
Author :
Aizenbud, Yaron ; Chang, Paul ; Koerlernann, B. ; Iyengar, Vijay ; Leibowitz, Moshe ; Smith, Dave ; Ros, Benjamin
fYear :
1992
Firstpage :
568
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Clocks; Computational modeling; Delay; Fault detection; Integrated circuit testing; Semiconductor device modeling; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1992. Proceedings., International
ISSN :
1089-3539
Print_ISBN :
0-7803-0760-7
Type :
conf
DOI :
10.1109/TEST.1992.527877
Filename :
527877
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1661406
