• DocumentCode
    1661406
  • Title

    AC Test Quality: Beyond Transition Fault Coverage

  • Author

    Aizenbud, Yaron ; Chang, Paul ; Koerlernann, B. ; Iyengar, Vijay ; Leibowitz, Moshe ; Smith, Dave ; Ros, Benjamin

  • fYear
    1992
  • Firstpage
    568
  • Keywords
    Circuit faults; Circuit simulation; Circuit testing; Clocks; Computational modeling; Delay; Fault detection; Integrated circuit testing; Semiconductor device modeling; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527877
  • Filename
    527877
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1661406