Title :
Job shop scheduling with multiple resources and an application to a semiconductor testing facility
Author :
Chen, Tsung-Rian ; Hsia, T.C.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
Abstract :
There are many cases of manufacturing problems in which a job requires more than one resource to be simultaneously available for processing. In this paper, we present a methodology for solving job shop scheduling problems with simultaneous resources. An application of the methodology to an IC test facility, where wafer sort and final test are performed, is presented
Keywords :
production control; IC test facility; final test; job shop scheduling; multiple resources; semiconductor testing facility; wafer sort; Application software; Application specific integrated circuits; Automobile manufacture; Computer aided manufacturing; Job shop scheduling; Lagrangian functions; Manufacturing processes; Processor scheduling; Semiconductor device manufacture; Semiconductor device testing;
Conference_Titel :
Decision and Control, 1994., Proceedings of the 33rd IEEE Conference on
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
0-7803-1968-0
DOI :
10.1109/CDC.1994.411220
