DocumentCode
1661478
Title
Job shop scheduling with multiple resources and an application to a semiconductor testing facility
Author
Chen, Tsung-Rian ; Hsia, T.C.
Author_Institution
Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
Volume
2
fYear
1994
Firstpage
1564
Abstract
There are many cases of manufacturing problems in which a job requires more than one resource to be simultaneously available for processing. In this paper, we present a methodology for solving job shop scheduling problems with simultaneous resources. An application of the methodology to an IC test facility, where wafer sort and final test are performed, is presented
Keywords
production control; IC test facility; final test; job shop scheduling; multiple resources; semiconductor testing facility; wafer sort; Application software; Application specific integrated circuits; Automobile manufacture; Computer aided manufacturing; Job shop scheduling; Lagrangian functions; Manufacturing processes; Processor scheduling; Semiconductor device manufacture; Semiconductor device testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Decision and Control, 1994., Proceedings of the 33rd IEEE Conference on
Conference_Location
Lake Buena Vista, FL
Print_ISBN
0-7803-1968-0
Type
conf
DOI
10.1109/CDC.1994.411220
Filename
411220
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