Title :
Concurrent on-line testing of identical circuits through output comparison using non-identical input vectors
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
Current designs may contain several identical copies of the same circuit (or functional unit). Such circuits can be tested by comparing the output vectors they produce under identical input vectors. This alleviates the need to observe the output response, and facilitates on-line testing. We show that testing of identical circuits by output comparison can be done effectively even when the input vectors applied to the circuits are not identical. This allows concurrent on-line testing even when the circuits are not driven front the same source during functional operation. We present experimental results to support the use of nonidentical input vectors for concurrent on-line testing of identical circuits.
Keywords :
concurrent engineering; fault simulation; integrated circuit design; integrated circuit testing; microprocessor chips; circuit functional unit; functional operation source; identical circuits concurrent on-line testing; nonidentical input vectors; on-line testing; output comparison; output response; output vectors; superscalar microprocessors; Built-in self-test; Circuit faults; Circuit testing; Cities and towns; Design for testability; Design methodology; Electrical fault detection; Fault tolerant systems; Microprocessors; Test pattern generators;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. 19th IEEE International Symposium on
Print_ISBN :
0-7695-2241-6
DOI :
10.1109/DFTVS.2004.1347872