Title :
Broadband spectrometers based on nano-scale difference interferometers
Author :
Yang, T. ; Li, C.C. ; Zhang, H.X. ; Ho, H.P.
Author_Institution :
Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Shatin, China
Abstract :
We present a chip-level integrated optical spectrometer and demonstrate its broadband and high resolution performance by using FDTD simulations. Designs of extruded and the pit structures show that the proposed device is low-cost and easy to fabricate as well.
Keywords :
charge-coupled devices; finite difference time-domain analysis; infrared spectrometers; integrated optics; light interferometers; nanophotonics; optical arrays; optical design techniques; visible spectrometers; FDTD simulations; PMMA substrate; broadband high resolution performance; charge-coupled device; chip-level integrated optical spectrometer; extruded structures; nanoscale difference interferometer array; optical design; optical fabrication; pit structures; Bandwidth; Charge coupled devices; Finite difference methods; Instruments; Interferometers; Optical films; Optical interferometry; Spectroscopy; Substrates; Time domain analysis;
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
DOI :
10.1109/INEC.2010.5424699
