• DocumentCode
    1661582
  • Title

    Repair of RAMs with clustered faults

  • Author

    Vinnakota, Bapiraju ; Andrews, Jason

  • Author_Institution
    Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
  • fYear
    1992
  • Firstpage
    582
  • Lastpage
    585
  • Abstract
    A graph-theoretic formulation for memory repair in the presence of clustered faults is presented. This approach is based on the use of variable-cell-size grids (VCS grids). As VCS grids can be represented by bipartite graphs, the reconfiguration problem for clustered faults can also be formulated as a vertex covering problem. Hence, graph-based reconfiguration algorithms developed by previous authors can be extended to exploit clustered fault distributions. Algorithms for memory repair that do not suffer from the restrictions imposed by previous algorithms for clustered faults are developed. A heuristic repair algorithm that has both improved performance and lower execution time than previous repair algorithms is presented
  • Keywords
    built-in self test; fault location; random-access storage; RAMs repairs; bipartite graphs; clustered faults; graph-theoretic formulation; heuristic repair algorithm; memory repair algorithms; reconfiguration problem; variable-cell-size grids; vertex covering problem; Approximation algorithms; Bipartite graph; Clustering algorithms; Costs; Polynomials; Read-write memory; Redundancy; Tellurium; Virtual colonoscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 1992. ICCD '92. Proceedings, IEEE 1992 International Conference on
  • Conference_Location
    Cambridge, MA
  • Print_ISBN
    0-8186-3110-4
  • Type

    conf

  • DOI
    10.1109/ICCD.1992.276221
  • Filename
    276221