DocumentCode :
1661582
Title :
Repair of RAMs with clustered faults
Author :
Vinnakota, Bapiraju ; Andrews, Jason
Author_Institution :
Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
fYear :
1992
Firstpage :
582
Lastpage :
585
Abstract :
A graph-theoretic formulation for memory repair in the presence of clustered faults is presented. This approach is based on the use of variable-cell-size grids (VCS grids). As VCS grids can be represented by bipartite graphs, the reconfiguration problem for clustered faults can also be formulated as a vertex covering problem. Hence, graph-based reconfiguration algorithms developed by previous authors can be extended to exploit clustered fault distributions. Algorithms for memory repair that do not suffer from the restrictions imposed by previous algorithms for clustered faults are developed. A heuristic repair algorithm that has both improved performance and lower execution time than previous repair algorithms is presented
Keywords :
built-in self test; fault location; random-access storage; RAMs repairs; bipartite graphs; clustered faults; graph-theoretic formulation; heuristic repair algorithm; memory repair algorithms; reconfiguration problem; variable-cell-size grids; vertex covering problem; Approximation algorithms; Bipartite graph; Clustering algorithms; Costs; Polynomials; Read-write memory; Redundancy; Tellurium; Virtual colonoscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1992. ICCD '92. Proceedings, IEEE 1992 International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-3110-4
Type :
conf
DOI :
10.1109/ICCD.1992.276221
Filename :
276221
Link To Document :
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