DocumentCode
1661582
Title
Repair of RAMs with clustered faults
Author
Vinnakota, Bapiraju ; Andrews, Jason
Author_Institution
Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
fYear
1992
Firstpage
582
Lastpage
585
Abstract
A graph-theoretic formulation for memory repair in the presence of clustered faults is presented. This approach is based on the use of variable-cell-size grids (VCS grids). As VCS grids can be represented by bipartite graphs, the reconfiguration problem for clustered faults can also be formulated as a vertex covering problem. Hence, graph-based reconfiguration algorithms developed by previous authors can be extended to exploit clustered fault distributions. Algorithms for memory repair that do not suffer from the restrictions imposed by previous algorithms for clustered faults are developed. A heuristic repair algorithm that has both improved performance and lower execution time than previous repair algorithms is presented
Keywords
built-in self test; fault location; random-access storage; RAMs repairs; bipartite graphs; clustered faults; graph-theoretic formulation; heuristic repair algorithm; memory repair algorithms; reconfiguration problem; variable-cell-size grids; vertex covering problem; Approximation algorithms; Bipartite graph; Clustering algorithms; Costs; Polynomials; Read-write memory; Redundancy; Tellurium; Virtual colonoscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design: VLSI in Computers and Processors, 1992. ICCD '92. Proceedings, IEEE 1992 International Conference on
Conference_Location
Cambridge, MA
Print_ISBN
0-8186-3110-4
Type
conf
DOI
10.1109/ICCD.1992.276221
Filename
276221
Link To Document