• DocumentCode
    1661650
  • Title

    A tool for automatic generation of BISTed and transparent BISTed RAMs

  • Author

    Kebichi, O. ; Nicolaidis, M.

  • Author_Institution
    IMAG, Grenoble, France
  • fYear
    1992
  • Firstpage
    570
  • Lastpage
    575
  • Abstract
    An efficient BIST architecture for RAMs that is based on M. Marinescu´s (1982) algorithm is presented. This architecture considers the different levels of hierarchy of the algorithm and uses a block to implement each level of this hierarchy. Efficient implementations for these blocks are given. A transparent BIST technique, i.e., a BIST technique that preserves the initial contents of the RAM, is also presented, and an efficient transparent BIST architecture for RAMs is proposed. A tool allowing the automatic generation of BISTed and transparent BISTed RAMs is given. This generator is developed around the CADENCE CAD tools and uses the ES2 SOLO2030 standard cell library (CMOS 1.2 μm)
  • Keywords
    CMOS integrated circuits; built-in self test; circuit CAD; integrated memory circuits; random-access storage; CADENCE CAD tools; CMOS 1.2 mu m; ES2 SOLO2030 standard cell library; automatic generation tool; implementations; memory architecture; transparent BISTed RAMs; Algorithm design and analysis; Built-in self-test; Circuit faults; Decoding; Fault detection; Libraries; Logic arrays; Logic testing; Read-write memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 1992. ICCD '92. Proceedings, IEEE 1992 International Conference on
  • Conference_Location
    Cambridge, MA
  • Print_ISBN
    0-8186-3110-4
  • Type

    conf

  • DOI
    10.1109/ICCD.1992.276223
  • Filename
    276223