Title :
LSSD COMPATIBLE AND CONCURRENTLY TESTABLE RAM
Author :
Maeno, H. ; Nii, K. ; Sakayanagi, S. ; Kato, S.
Keywords :
Application specific integrated circuits; Built-in self-test; Circuit faults; Circuit testing; Design methodology; Logic circuits; Logic testing; Monitoring; Multiplexing; Registers;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527881
