• DocumentCode
    1662485
  • Title

    LSSD COMPATIBLE AND CONCURRENTLY TESTABLE RAM

  • Author

    Maeno, H. ; Nii, K. ; Sakayanagi, S. ; Kato, S.

  • fYear
    1992
  • Firstpage
    608
  • Keywords
    Application specific integrated circuits; Built-in self-test; Circuit faults; Circuit testing; Design methodology; Logic circuits; Logic testing; Monitoring; Multiplexing; Registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527881
  • Filename
    527881
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1662485