DocumentCode :
1662627
Title :
In-Situ Measurements of Particle Size and Charge Distributions for Mars and Lunar Missions
Author :
Zhang, J. ; Srirama, P.K. ; Sharma, R. ; Mazumder, M.K.
Author_Institution :
Univ. of Arkansas at Little Rock, Little Rock
fYear :
2007
Firstpage :
427
Lastpage :
433
Abstract :
E-SPART analyzer is an instrument capable of measuring aerodynamic diameter and electrostatic charge distributions on a single particle basis in real time. A frequency biased laser Doppler velocimeter (LDV) is used to make non- contact in-situ analysis of the particles under ambient conditions, with respect to the temperature, pressure, and composition of the gaseous medium in which the particles are suspended. We report here new developments related to LDV optics, signal processor, and miniaturization of the E-SPART analyzer so that it can be applied on the surface of Mars and the Moon for characterization of dust particles. The conventional LDV was replaced with a diode laser based MiniLDV and we eliminated the frequency biasing device that requires either use of Bragg Cells or rotating diffraction grating with a new LDV beam geometry. The new optical system, a Stationary Fringe LDV (SFLDV), in which the fringe pattern in the sensing volume is stationary, is able to resolve directional ambiguity of an oscillating particle motion without a frequency bias between the two laser beams. Thus the complexity of the frequency biasing system is absent allowing both stability and robustness of the miniature E-SPART analyzer. For comparison between the conventional E-SPART analyzer and the new miniaturized instrument, experimental results on size and charge distributions for different test particle clouds are presented. The advantages of the new instrument for in-situ particle characterization for different industrial, pharmaceutical, and space explorations applications are discussed.
Keywords :
Mars; aerospace instrumentation; astronomical instruments; charge measurement; cosmic dust; lunar surface; measurement by laser beam; particle size measurement; E SPART analyzer; LDV optics; Mars mission; charge distributions; in situ particle size measurement; lunar mission; signal processor; Charge measurement; Current measurement; Electrostatic measurements; Frequency; Instruments; Mars; Moon; Optical sensors; Particle measurements; Size measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 2007. 42nd IAS Annual Meeting. Conference Record of the 2007 IEEE
Conference_Location :
New Orleans, LA
ISSN :
0197-2618
Print_ISBN :
978-1-4244-1259-4
Electronic_ISBN :
0197-2618
Type :
conf
DOI :
10.1109/07IAS.2007.69
Filename :
4347818
Link To Document :
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