Title :
A Testing Technique for ULSI Memory with On-chip Voltage Down Converter
Author :
Tsukude, M. ; Arimoto, Keisuke ; Hidaka, Hideto ; Konishi, Yasuo ; Hayashikoshi, Masanori
Keywords :
Circuit testing; Differential amplifiers; Fluctuations; Fuses; Laser tuning; Stress; Temperature dependence; Tunable circuits and devices; Ultra large scale integration; Voltage;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527882
