• DocumentCode
    166283
  • Title

    Loss tangent extraction based on equivalent conductivity derived from CPW measurements

  • Author

    Arz, Uwe

  • Author_Institution
    Phys.-Tech. Bundesanstalt (PTB), Braunschweig, Germany
  • fYear
    2014
  • fDate
    11-14 May 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We introduce a semi-numerical method to extract the loss tangent of low-loss microwave substrate materials from on-wafer scattering-parameter measurements in a wide frequency range. We compare to split-cylinder resonator measurements and demonstrate good agreement using structures built on GaAs and alumina substrates.
  • Keywords
    III-V semiconductors; alumina; coplanar waveguides; gallium arsenide; CPW measurements; GaAs; loss tangent extraction; low-loss microwave substrate materials; on-wafer scattering-parameter measurements; semi-numerical method; split-cylinder resonator measurements; Conductivity; Coplanar waveguides; Frequency measurement; Gallium arsenide; Loss measurement; Permittivity; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal and Power Integrity (SPI), 2014 IEEE 18th Workshop on
  • Conference_Location
    Ghent
  • Type

    conf

  • DOI
    10.1109/SaPIW.2014.6844537
  • Filename
    6844537
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=166283