1663011

A Self-Testing and Self-Repairing Structure for Ultra-Large Capacity Memories

Chen, Tom ; Sunada, Glen

1992

623

Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Logic testing; Performance evaluation; Production; Semiconductor device testing; Test equipment;

English

ieee

Test Conference, 1992. Proceedings., International

1089-3539

0-7803-0760-7

conf

10.1109/TEST.1992.527883

527883