Title :
Equivalent circuit model of the IC-Stripline coupling to IC package
Author :
HeeWon Kang ; WonJoo Jung ; Kyungsoo Kim ; Hyun Ho Park ; SoYoung Kim
Author_Institution :
Coll. of Inf. & Commun. Eng., Sungkyunkwan Univ., Suwon, South Korea
Abstract :
As the operating frequency of integrated circuit (IC) is rapidly increased, the importance of electromagnetic compatibility (EMC) performance test in the design stage of IC development process is becoming more significant. The new EMC test method, IC-Stripline enables fast and accurate EMC test with smaller form factor and lower cost compared with transverse electromagnetic (TEM) cell which is the most widely used for radiated electromagnetic interference test at the moment. This paper presents the equivalent lumped-element circuit model to capture capacitive and inductive coupling between open version of IC-Stripline and an IC package. Also, the equations to calculate the circuit components with geometrical structure of IC-Stripline are proposed. The S-parameter results from presented circuit models are compared against those obtained by 3D EM solver. The presented models are very accurate up to 3 GHz which is the upper limit of effective frequency range of IC-Stripline described in IEC standards [1], [2]. Therefore, the proposed IC-Stripline models can be effectively used to predict radiated emission and immunity of ICs using circuit level simulation tools.
Keywords :
S-parameters; TEM cells; electromagnetic compatibility; equivalent circuits; integrated circuit modelling; integrated circuit packaging; 3D EM solver; EMC; IC package; IC-stripline coupling; IEC standards; capacitive coupling; circuit level simulation tools; electromagnetic compatibility; electromagnetic interference test; equivalent circuit model; equivalent lumped-element circuit model; frequency 3 GHz; inductive coupling; integrated circuit; transverse electromagnetic cell; Couplings; Electromagnetic compatibility; Equations; Integrated circuit modeling; Mathematical model; Scattering parameters; 3D EM simulation; Circuit model; Electromagnetic compatibility (EMC); IC-Stripline; S-parameter; Transeverse electromagnetic (TEM) cell;
Conference_Titel :
Signal and Power Integrity (SPI), 2014 IEEE 18th Workshop on
Conference_Location :
Ghent
DOI :
10.1109/SaPIW.2014.6844556