Title :
Multiple fault detection in CMOS logic circuits
Author :
Lu, Ding ; Tong, Carol Q.
Author_Institution :
Dept. of Electr. Eng., Colorado State Univ., Fort Collins, CO, USA
Abstract :
The possibility of using a single stuck-at fault test set to detect multiple faults and their combinations is studied. It is shown that a single stuck-at fault test set can detect single and multiple self-feedback bridging faults and combinations of feedback bridging, input bridging, and stuck-on faults when current monitoring is done. It is proved that a single stuck-at fault test set can detect the combination of single stuck-open fault and some other faults like bridging and stuck-on faults when both logic and current monitoring are done
Keywords :
CMOS integrated circuits; fault location; feedback; integrated logic circuits; logic circuits; logic testing; CMOS logic circuits; current monitoring; feedback bridging; input bridging; multiple fault detection; multiple self-feedback bridging faults; single stuck-at fault test; single stuck-open fault; stuck-on faults; Automatic testing; CMOS logic circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Feedback; Logic testing; Monitoring; Very large scale integration;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1992. ICCD '92. Proceedings, IEEE 1992 International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-3110-4
DOI :
10.1109/ICCD.1992.276292
