Multiple fault detection in CMOS logic circuits

Author

Lu, Ding ; Tong, Carol Q.

Author_Institution

Dept. of Electr. Eng., Colorado State Univ., Fort Collins, CO, USA

fYear

1992

Firstpage

373

Lastpage

376

Abstract

The possibility of using a single stuck-at fault test set to detect multiple faults and their combinations is studied. It is shown that a single stuck-at fault test set can detect single and multiple self-feedback bridging faults and combinations of feedback bridging, input bridging, and stuck-on faults when current monitoring is done. It is proved that a single stuck-at fault test set can detect the combination of single stuck-open fault and some other faults like bridging and stuck-on faults when both logic and current monitoring are done

Keywords

CMOS integrated circuits; fault location; feedback; integrated logic circuits; logic circuits; logic testing; CMOS logic circuits; current monitoring; feedback bridging; input bridging; multiple fault detection; multiple self-feedback bridging faults; single stuck-at fault test; single stuck-open fault; stuck-on faults; Automatic testing; CMOS logic circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Feedback; Logic testing; Monitoring; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Design: VLSI in Computers and Processors, 1992. ICCD '92. Proceedings, IEEE 1992 International Conference on

Conference_Location

Cambridge, MA

Print_ISBN

0-8186-3110-4

Type

conf

DOI

10.1109/ICCD.1992.276292

Filename

276292