Title :
A blocker-tolerant wideband noise-cancelling receiver with a 2dB noise figure
Author :
Murphy, David ; Hafez, Amr ; Mirzaei, Ahmad ; Mikhemar, Mohyee ; Darabi, Hooman ; Chang, Mau-Chung Frank ; Abidi, Asad
Author_Institution :
Univ. of California, Los Angeles, Los Angeles, CA, USA
Abstract :
As narrowband off-chip RF filtering is not compatible with the concept of software-defined radio (SDR), an SDR receiver must be designed to tolerate large out-of-band blockers with minimal gain compression and noise figure degradation. A recent circuit tackles this problem by dispensing with the LNA entirely. This mixer-first approach achieves impressive linearity, but at the expense of noise figure and, since such a receiver has no gain prior to down-conversion, the flicker noise corner can be unacceptably high. Other SDR attempts invariably use a noise-cancelling LNA at the front end, which provides wideband matching, however such approaches have either inadequate linearity or display too large a noise for our purposes. In this work, we propose a hybrid frequency-translational, noise-cancelling (FTNC) receiver that employs two separate down-conversion paths to enable noise cancelling with no voltage gain prior to base-band filtering. The resulting design has a sub-2dB noise figure and tolerates 0dBm blockers with no gain back-off, breaking the traditional noise-linearity trade-off common in all receivers.
Keywords :
broadband networks; integrated circuit noise; interference suppression; microprocessor chips; radiofrequency filters; software radio; FTNC receiver; SDR receiver; base-band filtering; blocker-tolerant wideband noise-cancelling receiver; down-conversion path; hybrid frequency-translational noise-cancelling receiver; minimal gain compression; mixer-first approach; narrowband off-chip RF filtering; noise figure 2 dB; noise figure degradation; out-of-band blocker; software-defined radio; Mixers; Noise; Noise figure; Radio frequency; Receivers; Wideband;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2012 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4673-0376-7
DOI :
10.1109/ISSCC.2012.6176935