Title :
Testable Designs of Sequential Circuits under Highly Observable Condition
Author :
Xiaoqing, Wen ; Kinoshita, Kozo
Keywords :
Circuit faults; Circuit testing; Controllability; Electrical fault detection; Electron beams; Failure analysis; Observability; Sequential analysis; Sequential circuits; Very large scale integration;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527884
