DocumentCode
1663300
Title
Testable Designs of Sequential Circuits under Highly Observable Condition
Author
Xiaoqing, Wen ; Kinoshita, Kozo
fYear
1992
Firstpage
632
Keywords
Circuit faults; Circuit testing; Controllability; Electrical fault detection; Electron beams; Failure analysis; Observability; Sequential analysis; Sequential circuits; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1992. Proceedings., International
ISSN
1089-3539
Print_ISBN
0-7803-0760-7
Type
conf
DOI
10.1109/TEST.1992.527884
Filename
527884
Link To Document