Title :
The VLSI implementation of an artificial neural network scheme embedded in an automated inspection quality management system
Author :
Kung, Chih-Hsien ; Devaney, Michael J. ; Kung, Chih-Ming ; Huang, Chung-Ming ; Wang, Yi-jen ; Kuo, Chien-Ting
Author_Institution :
Chang-Jung Christian Univ., Tainan, Taiwan
fDate :
6/24/1905 12:00:00 AM
Abstract :
This paper describes in detail the VLSI implementation of an innovative artificial neural network scheme embedded in an automated inspection system for the manufacturing industry employing the digital image processing techniques. An FPGA-based prototype which has been implemented and integrated with the recently developed automated inspection system, and a standard cell-based prototype which is under development in the laboratory utilizing several high performance integrated circuit design tools are also described in this paper.
Keywords :
VLSI; cellular arrays; circuit CAD; computer integrated manufacturing; field programmable gate arrays; image processing equipment; inspection; integrated circuit design; neural chips; quality management; FPGA-based prototype; VLSI implementation; artificial neural network; automated inspection quality management system; digital image processing techniques; embedded artificial neural network; integrated circuit design tools; manufacturing industry; standard cell-based prototype; Application specific integrated circuits; Artificial neural networks; Digital images; Electronic mail; Field programmable gate arrays; Inspection; Intelligent networks; Neural networks; Quality management; Very large scale integration;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE
Print_ISBN :
0-7803-7218-2
DOI :
10.1109/IMTC.2002.1006846
