The VLSI implementation of an artificial neural network scheme embedded in an automated inspection quality management system

Author

Kung, Chih-Hsien ; Devaney, Michael J. ; Kung, Chih-Ming ; Huang, Chung-Ming ; Wang, Yi-jen ; Kuo, Chien-Ting

Author_Institution

Chang-Jung Christian Univ., Tainan, Taiwan

Volume

1

fYear

2002

fDate

6/24/1905 12:00:00 AM

Firstpage

239

Abstract

This paper describes in detail the VLSI implementation of an innovative artificial neural network scheme embedded in an automated inspection system for the manufacturing industry employing the digital image processing techniques. An FPGA-based prototype which has been implemented and integrated with the recently developed automated inspection system, and a standard cell-based prototype which is under development in the laboratory utilizing several high performance integrated circuit design tools are also described in this paper.

Keywords

VLSI; cellular arrays; circuit CAD; computer integrated manufacturing; field programmable gate arrays; image processing equipment; inspection; integrated circuit design; neural chips; quality management; FPGA-based prototype; VLSI implementation; artificial neural network; automated inspection quality management system; digital image processing techniques; embedded artificial neural network; integrated circuit design tools; manufacturing industry; standard cell-based prototype; Application specific integrated circuits; Artificial neural networks; Digital images; Electronic mail; Field programmable gate arrays; Inspection; Intelligent networks; Neural networks; Quality management; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE

ISSN

1091-5281

Print_ISBN

0-7803-7218-2

Type

conf

DOI

10.1109/IMTC.2002.1006846

Filename

1006846