Title :
A 100Mphoton/s time-resolved mini-silicon photomultiplier with on-chip fluorescence lifetime estimation in 0.13μm CMOS imaging technology
Author :
Tyndall, David ; Rae, Bruce ; Li, David ; Richardson, Justin ; Arlt, Jochen ; Henderson, Robert
Author_Institution :
Univ. of Edinburgh, Edinburgh, UK
Abstract :
Time-correlated single photon counting (TCSPC) is a technique whereby low-light signals are recorded with picosecond timing resolution relative to a synchronized optical impulse excitation, in order to extract the characteristic fluorescence decay constant, or lifetime [1]. Typical TCSPC apparatus includes a pulsed optical source, a discrete detector such as an avalanche photodiode (APD) or photomultiplier tube (PMT), external time-to-digital conversion (TDC) hardware and a PC to compute the decay constant, resulting in a bulky, expensive and power-hungry acquisition system. A major limitation of this approach is the restrictively low photon count limit of 1-to-5% of the excitation rate, which is necessary in order to avoid distortion due to photon `pile-up´ caused by both long detector dead-time and the inability of the TDC hardware to process more than one event per excitation period. As such, promising applications of TCSPC including cell cytometry, confocal microscopy, high throughput screening (HTS), and functional near infrared spectroscopy (fNIRS) are severely limited by peak acquisition rates of 1MHz. Although 100MHz has been achieved [2], the approach used is restricted to fluorescent dyes with lifetimes less than 2ns. Recent advances in single-photon avalanche diodes (SPADs) and on-chip TDCs manufactured in standard CMOS processes have enabled TCSPC measurements to be performed by an imaging array [3]; however such devices produce data at over 25Gb/s, have low fill factors of ~2% and pixel update rates are limited. Time-gated lifetime sensing significantly reduces the data bandwidth and processing time [4,5], but is photon inefficient and still limited by pile-up.
Keywords :
CMOS digital integrated circuits; CMOS image sensors; avalanche photodiodes; dyes; fluorescence; infrared spectroscopy; photodetectors; photomultipliers; photon counting; radiative lifetimes; system-on-chip; time-digital conversion; timing; CMOS imaging technology; SPAD detectors; SiPM architecture; TCSPC apparatus; TCSPC measurements; TDC hardware inability; cell cytometry; centre-of-mass method; confocal microscopy; decay constant; discrete detector; fluorescence decay constant; fluorescent dyes; functional near infrared spectroscopy; high throughput screening; low photon count limit; low-light signal; on-chip TDC; on-chip fluorescence lifetime estimation; organic fluorophores; photon pile-up; picosecond timing resolution; power-hungry acquisition system; pulsed optical source; single-photon avalanche diodes; size 0.13 mum; standard CMOS processes; synchronized optical impulse excitation; time-correlated single photon counting; time-gated lifetime sensing; time-multiplexed multichannel TDC architecture; time-resolved mini-silicon photomultiplier; time-to-digital conversion; Arrays; Coordinate measuring machines; Estimation; Fluorescence; Photonics; System-on-a-chip; Timing;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2012 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4673-0376-7
DOI :
10.1109/ISSCC.2012.6176946