Title :
High Quality Testing of Embedded RAMs Using Circular Self-Test Path
Author :
Krasniewski, Andrzej ; Pilarski, Slawomir
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Flip-flops; Programmable logic arrays; Random access memory; Read-write memory; Registers; Very large scale integration;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527886
