Title :
Solutions to current digital testing problems
Author_Institution :
Racal-Dana Instrum. Inc., Irvine, CA, USA
Abstract :
A model that describes how differences in interface and device propagation delays affect channel-to-channel skew performance is presented. A cost-effective digital test-system architecture, based on this model, is described. This architecture provides superior timing performance, while requiring only periodic maintenance calibration. Two ways to improve effective digital test rates are discussed. The first of these is to use high-speed disk storage within the digital test system. This can help to overcome the limitations imposed by slow host-computer operating systems. The second is a hardware-based data formatting procedure which reduces the excessive time required to perform digital data formatting operations
Keywords :
automatic test equipment; computer architecture; computer interfaces; data handling; digital instrumentation; electronic equipment testing; hard discs; ATE; channel-to-channel skew performance; cost-effective digital test-system architecture; data formatting; digital test rates; high-speed disk storage; interface; periodic maintenance calibration; timing performance; Accuracy; Automatic test pattern generation; Automatic testing; Hazards; Logic testing; Performance evaluation; Propagation delay; System testing; Test pattern generators; Timing;
Conference_Titel :
AUTOTESTCON '88. IEEE International Automatic Testing Conference, Futuretest. Symposium Proceedings
Conference_Location :
Minneapolis, MN
DOI :
10.1109/AUTEST.1988.9578
