• DocumentCode
    1664034
  • Title

    WARNING: 100% Fault Coverage May Be Misleading!!

  • Author

    Abramovici, Miron ; Parikh, Prashant S.

  • fYear
    1992
  • Firstpage
    662
  • Keywords
    Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Design for testability; Electrical fault detection; Fault detection; Probes; Sequential analysis; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527887
  • Filename
    527887