DocumentCode
1664034
Title
WARNING: 100% Fault Coverage May Be Misleading!!
Author
Abramovici, Miron ; Parikh, Prashant S.
fYear
1992
Firstpage
662
Keywords
Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Design for testability; Electrical fault detection; Fault detection; Probes; Sequential analysis; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1992. Proceedings., International
ISSN
1089-3539
Print_ISBN
0-7803-0760-7
Type
conf
DOI
10.1109/TEST.1992.527887
Filename
527887
Link To Document