Title :
WARNING: 100% Fault Coverage May Be Misleading!!
Author :
Abramovici, Miron ; Parikh, Prashant S.
Keywords :
Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Design for testability; Electrical fault detection; Fault detection; Probes; Sequential analysis; System testing;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527887
