Title :
Extending the range and accuracy of phase noise measurements
Author :
Walls, F.L. ; Clements, A.J.D. ; Felton, C.M. ; Lombardi, M.A. ; Vanek, M.D.
Author_Institution :
NBS, Boulder, CO, USA
Abstract :
Recent progress in extending high-accuracy measurements of phase noise in oscillators and other devices are described for carrier frequencies from the RF to the millimeter region and Fourier frequencies up to 10% of the carrier (or a maximum of about 1 GHz). A brief survey of traditional precision techniques for measuring phase noise is included as a basis for comparing relative performance and limitations. Several calibration techniques are developed which, when combined with two previous oscillator techniques, permit one to calibrate all factors affecting the measurements of phase noise of oscillator pairs to an accuracy which typically exceeds 1 dB and in favorable cases can approach 0.4 dB
Keywords :
calibration; electric noise measurement; electron device noise; oscillators; Fourier frequencies; RF; calibration; millimeter region; oscillators; phase noise measurements; Calibration; Frequency conversion; Frequency measurement; Frequency synthesizers; NIST; Noise measurement; Oscillators; Phase measurement; Phase noise; Q measurement;
Conference_Titel :
Frequency Control Symposium, 1988., Proceedings of the 42nd Annual
Conference_Location :
Baltimore, MD
DOI :
10.1109/FREQ.1988.27636