Title :
Compressed embedded diagnosis of logic cores
Author :
Ollivierre, Scott ; Kinsman, Adam B. ; Nicolici, Nicola
Author_Institution :
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont., Canada
Abstract :
This paper introduces a new method for deterministic diagnosis of logic cores. The proposed method is based on on-chip decompression and comparison of incompletely specified test patterns and test responses. Using experimental data, the trade-offs between the number of tester channels, on-chip area and scan time are discussed.
Keywords :
built-in self test; embedded systems; integrated memory circuits; logic testing; system-on-chip; built-in self test; embedded diagnosis; integrated memory circuits; logic cores; on-chip decompression; Built-in self-test; Circuit testing; Hardware; Isolation technology; Logic; Manufacturing processes; Packaging; Production; System-on-a-chip; Test data compression;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. IEEE International Conference on
Print_ISBN :
0-7695-2231-9
DOI :
10.1109/ICCD.2004.1347973
