• DocumentCode
    1664461
  • Title

    A ±0.4°C (3σ) −70 to 200°C time-domain temperature sensor based on heat diffusion in Si and SiO2

  • Author

    Van Vroonhoven, Caspar ; D´Aquino, Dan ; Makinwa, Kofi

  • Author_Institution
    Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2012
  • Firstpage
    204
  • Lastpage
    206
  • Abstract
    Despite the increasing use of ICs at very high temperatures (>;150°C) in automotive and industrial applications, sensing such temperatures is still mostly done with discrete thermocouples or thermistors. This is because conventional integrated temperature sensors are based on BJTs, which have a strongly process-, stress- and temperature-dependent saturation current (Is). Together with other leakage currents, this leads to rapidly increasing temperature errors at high temperatures: up to ±3.0°C at 200°C [1].
  • Keywords
    leakage currents; temperature sensors; thermistors; thermocouples; IC; SiO2; automotive application; discrete thermocouples; heat diffusion; industrial application; leakage currents; process-dependent saturation current; stress-dependent saturation current; temperature 200 C; temperature-dependent saturation current; thermistors; time-domain temperature sensor; Heating; Silicon; Temperature distribution; Temperature measurement; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2012 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    978-1-4673-0376-7
  • Type

    conf

  • DOI
    10.1109/ISSCC.2012.6176976
  • Filename
    6176976